Stabilizing the metastable γ phase in Ga2O3 thin films by Cu doping
- 1. Center for Optoelectronics Materials and Devices, Department of Physics, Zhejiang Sci-Tech University, Hangzhou, 310018, Zhejiang (China)
- 2. State Key Laboratory of Information Photonics and Optical Communications & Laboratory of Optoelectronics Materials and Devices, School of Science, Beijing University of Posts and Telecommunications, Beijing, 100876 (China)
Description
Highlights: • The metastable γ-Ga2O3 was stabilized by Cu doping through sol-gel method. • A single γ-phase Ga2O3 can be obtained with 12.5 at % Cu doping at 700 °C. • The band gap of Ga2O3 thin films displays a clear red-shift with Cu doping. • The PL intensity of γ-Ga2O3 at UV-blue emission is obviously stronger than β-Ga2O3. The metastable cubic γ phase Ga2O3 with a defect spinel structure presents several fascinating properties, which may be a more attractive material than the stable β form. Herein, we found that the metastable γ-Ga2O3 can be stabilized by copper (Cu) doping through a simple operation and low cost method of sol-gel. The γ-Ga2O3 thin films were prepared under the annealing of 700 °C in nitrogen atmosphere for Cu doping. The β phase Ga2O3 ones were obtained at the same condition without the Cu dopant. While the Cu doped γ phase Ga2O3 will transform to β phase for a high annealing temperature above 800 °C. The grain size of Cu doped γ-Ga2O3 and undoped β-Ga2O3 thin films increases with the increase of the annealing temperature. The UV–Vis absorption spectrum of the β-Ga2O3 thin film exhibits a sharp intrinsic absorption edge at ∼250 nm, whilst Cu doped γ-Ga2O3 thin film displays an obvious red-shift. The band gap decreases from 4.90 eV to 4.38 eV for the Cu doping. The photoluminescence intensity at the ultraviolet and blue region of Cu doped γ-Ga2O3 thin films are stronger than undoped β-Ga2O3, which can be attributed to the introduction of more defects such as oxygen vacancies in γ phase by Cu doping.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2017.10.162Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2017.10.162;
- PII
- S0925838817335983;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 731
- Journal Page Range
- p. 1225-1229
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53037456
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTRA; ANNEALING; COPPER ADDITIONS; DEFECTS; DOPED MATERIALS; GALLIUM OXIDES; PHOTOLUMINESCENCE; RED SHIFT; SOL-GEL PROCESS; SPINELS; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; ULTRAVIOLET RADIATION; VACANCIES
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COPPER ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; EMISSION; FILMS; GALLIUM COMPOUNDS; HEAT TREATMENTS; LUMINESCENCE; MATERIALS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; POINT DEFECTS; RADIATIONS; SORPTION; SPECTRA; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier B.V. All rights reserved.