Transparent p-type conducting K-doped NiO films deposited by pulsed plasma deposition
Creators
Description
Transparent p-type conducting K-doped NiO thin films were prepared by pulsed plasma deposition. The structural, electrical and optical properties of the films were investigated using X-ray diffraction, atomic force microscope, X-ray photoelectron spectroscopy, Hall measurement, and ultraviolet–visible spectroscopy, respectively. The dependency of film properties on K doping content and substrate temperature was studied. The film with K doping content of 25 at.% deposited at room temperature exhibits the highest conductivity of 4.25 S cm−1 and an average transmittance of nearly 60% in visible light region. - Highlights: ► P-type K-doped NiO films were deposited by pulsed plasma deposition. ► The resistivity of the films is lowered with proper doping content. ► The film crystallinity is improved with the increase of substrate temperature. ► The film deposited at room temperature exhibits the conductivity of 4.25 S cm−1.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.05.005Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.05.005;
- PII
- S0040-6090(12)00579-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 18
- Journal Page Range
- p. 5884-5888
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108461
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DEPOSITION; DOPED MATERIALS; NICKEL OXIDES; OPTICAL PROPERTIES; PLASMA; POTASSIUM; SUBSTRATES; THIN FILMS; VISIBLE RADIATION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALKALI METALS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; MATERIALS; METALS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.