Published June 3, 2013
| Version v1
Journal article
Catalyst free growth of ZnO nanorods by thermal evaporation method
Creators
- 1. Centre for Research in Microelectronics (CRME), Department of Electronics Engineering Indian Institute of Technology (Banaras Hindu University), Varanasi Uttar Pradesh-221005 (India)
Description
In this work, we report catalyst free growth of ZnO nanorods on n-Si substrate by a low cost thermal evaporation method. The surface morphology, chemical composition and crystalline structure of ZnO nanorods have been determined by scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS) and X-ray diffraction (XRD) spectroscopy respectively. It is found that, the as –deposited ZnO seed layer reduces lattice mismatching between ZnO and Si from 40.3 to 0.28%, therefore enhances the subsequent growth and crystalline quality of ZnO nanorods on Si substrate. The present methodology is simple, cost effective and highly applicable for synthesis of ZnO nanorods for optoelectronics applications.
Additional details
Identifiers
- DOI
- 10.1063/1.4810132;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1536
- Journal Issue
- 1
- Journal Page Range
- p. 125-126
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International conference on recent trends in applied physics and material science
- Acronym
- RAM 2013
- Dates
- 1-2 Feb 2013
- Place
- Bikaner, Rajasthan (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44075169
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL COMPOSITION; CRYSTAL DEFECTS; CRYSTAL GROWTH; EVAPORATION; LAYERS; MORPHOLOGY; NANOSTRUCTURES; QUANTITATIVE CHEMICAL ANALYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON; SUBSTRATES; SURFACES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; SCATTERING; SEMIMETALS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS; ZINC COMPOUNDS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC