The Data Evaluation for Obtaining Accuracy and Reliability
- 1. National center for standard reference data, Korea Research Institute of Standards and Science, 1, Doryong-dong, Yu-seong-Gu, Daejeon 305-340, Rep. of Korea (Korea, Republic of)
Description
Nemours scientific measurement results are flooded from the paper, data book, etc. as fast growing of internet. We meet many different measurement results on the same measurand. In this moment, we are face to choose most reliable one out of them. But it is not easy to choose and use the accurate and reliable data as we do at an ice cream parlor. Even expert users feel difficult to distinguish the accurate and reliable scientific data from huge amount of measurement results. For this reason, the data evaluation is getting more important as the fast growing of internet and globalization. Furthermore the expressions of measurement results are not in standardi-zation. As these need, the international movement has been enhanced. At the first step, the global harmonization of terminology used in metrology and the expression of uncertainty in measurement were published in ISO. These methods are wide spread to many area of science on their measurement to obtain the accuracy and reliability. In this paper, it is introduced that the GUM, SRD and data evaluation on atomic collisions.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/388/15/152014Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 388
- Journal Issue
- 15
- Journal Page Range
- [1 p.]
- ISSN
- 1742-6596
Conference
- Title
- 27. international conference on photonic, electronic and atomic collisions
- Acronym
- ICPEAC 2011
- Dates
- 27 Jul - 2 Aug 2011
- Place
- Belfast, Northern Ireland (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44033702
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ATOM COLLISIONS; ELECTRONIC STRUCTURE; ENERGY LEVELS; MEASURING METHODS; RELIABILITY; VALIDATION
- Descriptors DEC
- COLLISIONS; TESTING