Published March 5, 2014 | Version v1
Journal article

Measurements of ultra-low-energy electron scattering cross sections of atoms and molecules

  • 1. Department of Chemistry, Tokyo Institute of Technology, 152-8551 Tokyo (Japan)
  • 2. Department of Physics, Sophia University, 102-8554 Tokyo, Japan and Department of Chemistry, Tokyo Institute of Technology, 152-8551 Tokyo (Japan)
  • 3. Department of Physics, Sophia University, 102-8554 Tokyo (Japan)
  • 4. Photon Factory, Institute of Materials Structure Science, 305-0801 Tsukuba (Japan)

Description

A new experimental technique for the total cross section measurements of ultra-low energy electron collisions with atoms and molecules utilizing the synchrotron radiation is presented. The technique employs a combination of the penetrating field technique and the threshold photoionization of rare gas atoms using the synchrotron radiation as an electron source in order to produce a high resolution electron beam at very low energy. Absolute total cross sections for electron scattering from He, Ne, Ar, Kr, and Xe in the energy region from extremely low electron energy to 20 eV are presented

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1588
Journal Issue
1
Journal Page Range
p. 78-86
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
4. international meeting on frontiers in physics
Dates
27-30 Aug 2013
Place
Kuala Lumpur (Malaysia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45087418
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON BEAMS; ELECTRON COLLISIONS; ELECTRON SOURCES; ELECTRONS; PHOTOIONIZATION; SCATTERING; SYNCHROTRON RADIATION; TOTAL CROSS SECTIONS
Descriptors DEC
BEAMS; BREMSSTRAHLUNG; COLLISIONS; CROSS SECTIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZATION; LEPTON BEAMS; LEPTONS; PARTICLE BEAMS; PARTICLE SOURCES; RADIATION SOURCES; RADIATIONS

Optional Information

Notes
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