Transient liquid phase Ag-based solder technology for high-temperature packaging applications
Creators
- 1. Department of Materials and Metallurgical Engineering, Bangladesh University of Engineering and Technology, Dhaka 1000 (Bangladesh)
- 2. School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798 (Singapore)
Description
Highlights: • Ag-based transient-liquid-phase (TLP) bonding for high-temperature applications. • The shear strength measured at 250 °C showed good high temperature performance. • A higher amount of Sn content than the stoichiometric ratio needed for joining Cu UBM. • Ag–Sn TLP bonding is an effective interconnection method for harsh environment. -- Abstracts: A lead-free Ag-based soldering technique through transient-liquid-phase (TLP) bonding is proposed in this study for high-temperature microelectronic packaging applications. The solder paste, which contained Ag and Sn powders with a no-clean flux, was used to join Cu substrates. The setup was bonded at 250 °C for 10 minutes. The study focuses on mechanical and microstructural characterizations of the joints. The shear strength measured at 250 °C shows good high temperature performance of the joint. The effects of Ag and Sn contents on mechanical, electrical and thermal properties of sintered bulk Ag–Sn samples were also investigated independently. The results demonstrate that the Ag–Sn TLP bonding is an effective interconnection method for harsh environment electronic packaging
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2013.10.204Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2013.10.204;
- PII
- S0925-8388(13)02630-3;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 587
- Journal Page Range
- p. 365-368
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45054224
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BONDING; INTERMETALLIC COMPOUNDS; LIQUIDS; MICROELECTRONICS; MICROSTRUCTURE; PACKAGING; POWDERS; RELIABILITY; SHEAR PROPERTIES; SOLDERING; SUBSTRATES; TEMPERATURE RANGE 0400-1000 K; THERMODYNAMIC PROPERTIES; TRANSIENTS
- Descriptors DEC
- ALLOYS; FABRICATION; FLUIDS; JOINING; MECHANICAL PROPERTIES; PHYSICAL PROPERTIES; TEMPERATURE RANGE; WELDING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.