Published December 15, 2009
| Version v1
Journal article
TiO2/Au/TiO2 multilayer thin films: Novel metal-based transparent conductors for electrochromic devices
- 1. Department of Engineering Sciences, The Angstroem Laboratory, Uppsala University, P.O. Box 534, SE-751 21 Uppsala (Sweden)
Description
Transparent conductors based on Au films, with thicknesses in the 2.6 < d < 9.8 nm range, were made by DC magnetron sputtering onto glass. The films went from an 'island' structure at low thicknesses to a uniform structure at d > 8 nm, as seen from electron microscopy, electrical resistance, and spectrophotometric transmittance and reflectance. Optical data for uniform films were given a consistent interpretation within the Drude model. Optimized TiO2/Au/TiO2 films, with a luminous transmittance of 80%, were found to have good electrochemical durability and may be useful for applications in electrochromic devices.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2009.02.158Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2009.02.158;
- PII
- S0040-6090(09)00752-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 4
- Journal Page Range
- p. 1225-1229
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42058045
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTROCHROMISM; ELECTRON MICROSCOPY; GLASS; GOLD; LAYERS; MAGNETRONS; SIMULATION; SPECTROPHOTOMETRY; SPUTTERING; THICKNESS; THIN FILMS; TITANIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMISTRY; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELECTRO-OPTICAL EFFECTS; ELEMENTS; EQUIPMENT; FILMS; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.