Designing interlayers to improve the mechanical reliability of transparent conductive oxide coatings on flexible substrates
Creators
- 1. Department of Materials Science and Engineering, Yonsei University, Seoul 120-749 (Korea, Republic of)
Description
In this study, we investigate the effect of interlayers on the mechanical properties of transparent conductive oxide (TCO) on flexible polymer substrates. Indium tin oxide (ITO), which is the most widely used TCO film, and Ti, which is the most widely used adhesive interlayer, are selected as the coating and the interlayer, respectively. These films are deposited on the polymer substrates using dc-magnetron sputtering to achieve varying thicknesses. The changes in the following critical factors for film cracking and delamination are analyzed: the internal stress (σi) induced in the coatings during deposition using a white light interferometer, the crystallinity using a transmission electron microscope, and the surface roughness of ITO caused by the interlayer using an atomic force microscope. The resistances to the cracking and delamination of ITO are evaluated using a fragmentation test. Our tests and analyses reveal the important role of the interlayers, which significantly reduce the compressive σi that is induced in the ITO and increase the resistance to the buckling delamination of the ITO. However, the relaxation of σi is not beneficial to cracking because there is less compensation for the external tension as σi further decreases. Based on these results, the microstructural control is revealed as a more influential factor than σi for improving crack resistance.
Additional details
Identifiers
- DOI
- 10.1063/1.4709295;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 111
- Journal Issue
- 9
- Journal Page Range
- p. 093505-093505.8
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43129329
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COATINGS; CRACKS; FILMS; INDIUM COMPOUNDS; MECHANICAL PROPERTIES; MICROSTRUCTURE; POLYMERS; RELAXATION; RESIDUAL STRESSES; ROUGHNESS; SPUTTERING; SUBSTRATES; SURFACES; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; VISIBLE RADIATION
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; STRESSES; SURFACE PROPERTIES; TIN COMPOUNDS
Optional Information
- Notes
- (c) 2012 American Institute of Physics