Published March 1972
| Version v1
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The electron probe microanalyser udes for determining the x-ray emission distribution in carbon and the thickness of carbon films on metal surfaces
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
3027048.pdf
Files
(492.3 kB)
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Additional details
Publishing Information
- Imprint Pagination
- 31 p.
- Report number
- AECL--3959
INIS
- Country of Publication
- Canada
- Country of Input or Organization
- Canada
- INIS RN
- 3027048
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- CARBON; DEPOSITS; ELECTRON PROBES; FILMS; IRON; NONDESTRUCTIVE TESTING; ORGANIC COOLED REACTORS; THICKNESS; X-RAY SPECTRA
- Descriptors DEC
- ELEMENTS; MATERIALS TESTING; METALS; NONMETALS; PROBES; REACTORS; SPECTRA; TESTING; TRANSITION ELEMENTS
Optional Information
- Notes
- 10 refs.