Published February 2019
| Version v1
Journal article
Evidence for honeycomb-chained trimer structure of multilayer silicene on Ag(111) with noncontact atomic force microscopy
Creators
- 1. Tokyo University, Department of Advanced Materials Science, Kashiwa, Chiba (Japan)
Description
The structure of multilayer silicene on Ag(111) was examined by noncontact atomic force microscopy (AFM) with atomic resolution. We obtained topographic images of multilayer silicene with specific features depending on the tip-to-sample distance and the tip apex. Our results strongly suggest that multilayer silicene on Ag(111) has the same surface structure as the honeycomb-chained trimer structure of Si(111) √3 x √3 R30°-Ag rather than Si honeycomb structures. This study opens a new method for structure determination using the diversity of AFM imaging patterns dominated by interactions between tip and surface. (author)
Availability note (English)
Available from https://doi.org/10.7567/1347-4065/aaf4b5Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics (Online)
- Journal Volume
- 58
- Journal Issue
- 2
- Journal Page Range
- p. 020903.1-020903.5
- ISSN
- 1347-4065
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 50049136
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ARGON IONS; ATOMIC FORCE MICROSCOPY; ELECTRON DIFFRACTION; GRAIN ORIENTATION; HALL EFFECT; HONEYCOMB STRUCTURES; INTERATOMIC DISTANCES; OSCILLATIONS; QUANTUM STATES; SCANNING TUNNELING MICROSCOPY; SILICENE; SPIN; TOPOGRAPHY; TRIANGULAR CONFIGURATION; X-RAY DIFFRACTION
- Descriptors DEC
- ANGULAR MOMENTUM; CHARGED PARTICLES; COHERENT SCATTERING; CONFIGURATION; DIFFRACTION; DISTANCE; ELEMENTS; IONS; MECHANICAL STRUCTURES; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; PARTICLE PROPERTIES; SCATTERING; SEMIMETALS; SILICON
Optional Information
- Notes
- 28 refs., 4 figs., 1 tab.