Published April 2017 | Version v1
Journal article

Cohesion strength and atomic structure of W-Cu graded interfaces

Description

W-Cu graded interface is a solution to big differences of properties between W and Cu, while the number and composition of graded layers in the literature are quite different. The present first principles calculation reveals that W-rich graded interfaces possess higher strength and lower interface energy than Cu-rich counterparts. It shows that the differences of thermal expansion and Young's modulus between overlayer and substrate are decisive factors in the design of Cu-rich and W-rich graded interfaces, respectively. A graded structure of W8Cu1/W7Cu2/W6Cu3/Cu6W3/Cu8W1 is therefore suggested theoretically.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.fusengdes.2017.02.032

Additional details

Identifiers

DOI
10.1016/j.fusengdes.2017.02.032;
PII
S0920-3796(17)30115-1;

Publishing Information

Journal Title
Fusion Engineering and Design
Journal Volume
117
Journal Page Range
p. 20-23
ISSN
0920-3796
CODEN
FEDEEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48074351
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
COPPER; INTERFACES; LAYERS; SUBSTRATES; THERMAL EXPANSION; TUNGSTEN
Descriptors DEC
ELEMENTS; EXPANSION; METALS; REFRACTORY METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.