Published 1989 | Version v1
Report Metadata-only

Applications of secondary ion mass spectrometry (SIMS) to the analysis of samples related to nuclear technology

Creators

  • 1. Technische Univ. Muenchen, Garching (Germany, F.R.). Inst. fuer Radiochemie

Description

Published in summary form only

Additional details

Publishing Information

Imprint Title
Second Karlsruhe international conference on analytical chemistry in nuclear technology
Imprint Pagination
223 p.
Journal Page Range
vp.
Report number
INIS-mf--11989

Conference

Title
2. Karlsruhe international conference on analytical chemistry in nuclear technology.
Dates
5-9 Jun 1989.
Place
Karlsruhe (Germany, F.R.).

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
20065260
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
GLASS; HIGH-LEVEL RADIOACTIVE WASTES; IODINE 129; ION MICROPROBE ANALYSIS; LEACHATES; MASS SPECTROSCOPY; PLUTONIUM; SOILS; WASTE FORMS
Descriptors DEC
ACTINIDES; BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; CHEMICAL ANALYSIS; DISPERSIONS; ELEMENTS; HOMOGENEOUS MIXTURES; INTERMEDIATE MASS NUCLEI; INTERNAL CONVERSION RADIOISOTO; IODINE ISOTOPES; ISOTOPES; MATERIALS; METALS; MICROANALYSIS; MIXTURES; NONDESTRUCTIVE ANALYSIS; NUCLEI; ODD-EVEN NUCLEI; RADIOACTIVE MATERIALS; RADIOACTIVE WASTES; RADIOISOTOPES; SOLUTIONS; SPECTROSCOPY; TRANSURANIUM ELEMENTS; WASTES; YEARS LIVING RADIOISOTOPES