Published 1994
| Version v1
Book
Alpha-spectrometric determination of low activities of Th, U, and Pu with semiconductor and grid ionization chamber
Description
The direct preparation of alpha-containing counter layers from TOPO extracts by vaporization on the counter planchet is described. For a typical surface density of 2 μl/cm2 the half-widths of the peaks in the semiconductor and grid ionization chamber (GIK) are mostly in the range of 50 keV. However, 20 times more material can be prepared on the large surface of the GIK counter planchets than in the semiconductor chamber. Alpha emitters of a few mBq can be detected in the GIK within a measuring time of 1 d, depending on their position in the spectrum. (orig.)
Abstract (German)
Es wird die Direktpraeparation von alphahaltigen Zaehlschichten aus TOPO-Extrakten durch Verdampfen auf der Zaehlschale beschrieben. Bei einer typischen Flaechenbelegung von 2 μl/cm2 liegen die Halbwertsbreiten der Peaks in der Halbleiter- und in der Gitterionisationskammer (GIK) meist bei 50 keV. Auf der grossen Flaeche der Zaehlschalen der GIK kann aber 20 mal so viel Material praepariert werden wie an der Halbleiterkammer. Bei 1 d Messzeit lassen sich in der GIK je nach Lage im Spektrum wenige mBq Alphastrahler erkennen. (orig.)Additional details
Additional titles
- Original title (German)
- Alpha-spektrometrische Bestimmung geringer Aktivitaeten von Th, U, Pu mit Halbleiter und Gitterionisationskammer
Publishing Information
- Publisher
- Verl. TUeV Rheinland.
- Imprint Place
- Koeln (Germany)
- ISBN
- 3-8249-0212-5
- Imprint Title
- Radiation protection: Physics and measurement techniques. Vol. 1. Proceedings
- Imprint Pagination
- 434 p.
- Series
- Publikationsreihe Fortschritte im Strahlenschutz.
- Journal Page Range
- p. 305-310.
- ISSN
- 1013-4506
Conference
- Title
- Radiation protection - physics and measurement techniques.
- Original Conference Title
- 26. Jahrestagung des Fachverbandes fuer Strahlenschutz e.V. (FS): Strahlenschutz - Physik und Messtechnik
- Acronym
- 26. annual meeting of Fachverband fuer Strahlenschutz e.V. (FS)
- Dates
- 24-26 May 1994.
- Place
- Karlsruhe (Germany).
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 28024680
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S54: ENVIRONMENTAL SCIENCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA DECAY RADIOISOTOPES; ALPHA DETECTION; ALPHA SPECTROSCOPY; LOW LEVEL COUNTING; MULTIWIRE IONIZATION CHAMBERS; PLUTONIUM ISOTOPES; RADIOACTIVE EFFLUENTS; RADIOACTIVE WASTES; SAMPLE PREPARATION; SEMICONDUCTOR DETECTORS; THORIUM ISOTOPES; TOPO; URANIUM ISOTOPES
- Descriptors DEC
- CHARGED PARTICLE DETECTION; COUNTING TECHNIQUES; DETECTION; IONIZATION CHAMBERS; ISOTOPES; MATERIALS; MEASURING INSTRUMENTS; ORGANIC COMPOUNDS; ORGANIC PHOSPHORUS COMPOUNDS; PHOSPHINE OXIDES; RADIATION DETECTION; RADIATION DETECTORS; RADIOACTIVE MATERIALS; RADIOISOTOPES; SPECTROSCOPY; WASTES
Optional Information
- Notes
- Imprint:Strahlenschutz: Physik und Messtechnik. Bd. 1. Vortraege.
- Secondary number(s)
- FS--94-71-T(v.1).