Published August 1985 | Version v1
Report Restricted

Specular and diffuse reflection of soft x-rays from mirrors

Creators

Description

Measurements of surface scattering from plane mirrors with different degrees of roughness using soft x-rays are reported. Angle resolved distributions of s-polarized light, scattered in the plane of incidence, were obtained with a precise reflectometer for various angles of incidence and different wavelengths. The influence of the sample preparation and the optical constants on the scattering properties is shown

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01; 1 as DE86000620.

Files

Restricted

The record is publicly accessible, but files are restricted to users with access.

Additional details

Publishing Information

Imprint Pagination
17 p.
Report number
LBL--20116

Conference

Title
2. international synchrotron radiation instrumentation conference.
Dates
29 Jul - 2 Aug 1985.
Place
Stanford, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17028220
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
MIRRORS; REFLECTION; SCATTERING; SOFT X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; X RADIATION

Optional Information

Secondary number(s)
CONF-850734--14.