Published August 2008
| Version v1
Journal article
Improving EFTEM data using multivariate statistical analysis
Creators
- 1. Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford (United Kingdom)
Description
In this paper, the benefits of processing Energy-Filtered TEM (EFTEM) datasets with Multivariate Statistical Analysis will be described. These include: Isolation of the main sources of information, identification of features masked by noise and/or background and, more importantly, almost 'noise-free' data reconstruction.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/126/1/012040Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 126
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
- Acronym
- EMAG 2007
- Dates
- 3-7 Sep 2007
- Place
- Glasgow, Scotland (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41036505
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DATA PROCESSING; DIGITAL FILTERS; MULTIVARIATE ANALYSIS; NOISE; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; MATHEMATICS; MICROSCOPY; PROCESSING; STATISTICS