Fabrication of Reduced Graphene Oxide Thin Films on Corona Treated Silicon Substrates
- 1. Vietnam National University, Ho Chi Minh City (Viet Nam)
- 2. Institute for Nanotechnology, Ho Chi Minh City (Viet Nam)
Description
Highlights: • Corona plasma was used to treat silicon substrate surfaces • Reduced graphene oxide (rGO) was formed by short time annealing of spun GO layers • Large area and uniform rGO films were obtained • rGO films had sheet resistance of the order of 5-35 ohm/sq Graphene is a material with excellent properties. However, the manufacture of a single-layer graphene film with a large area is challenging. It requires modern and expensive equipment. In this study, we suggested another approach to improve these problems. The raw material graphite was used to prepare graphene oxide solutions. The resulting graphene oxide solutions were then dispersed onto silicon substrates first treated with corona plasma, which increases the adhesion between materials and substrates. In the next step, these covered substrates were deoxygenated by heating at very high temperatures for a short time to form reduced graphene oxide, which has graphene-like properties. The reduced graphene oxide films formed had a uniform structure over a large area of 2 × 2 cm2 with an oxygen content of about 4%, a film roughness of less than 5 nm, and a sheet resistance of 4-5 ohm/square.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2021.138693Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2021.138693;
- PII
- S0040609021001760;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 728
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54007943
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADHESION; ANNEALING; FABRICATION; GRAPHENE; GRAPHITE; HEATING; LAYERS; OXIDES; PLASMA; RAW MATERIALS; ROUGHNESS; SHEETS; SILICON; SUBSTRATES; SURFACES; THIN FILMS
- Descriptors DEC
- CARBON; CHALCOGENIDES; ELEMENTS; FILMS; HEAT TREATMENTS; MATERIALS; MINERALS; NONMETALS; OXYGEN COMPOUNDS; SEMIMETALS; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.