Published October 1, 2013 | Version v1
Journal article

Sol–gel derived ZnO–CeO2 thin films on glass substrate

Description

The microstructure and optical properties of crystalline ZnO–CeO2 thin films on glass substrate at various preheating temperatures, annealing temperatures and time were investigated. The relative intensity ratio values of the diffraction peaks of ZnO–CeO2 thin films and grain growth behavior were related to the preheating temperature, annealing temperature, and time. A suitable thermal treatment results in higher surface energy, which improves the surface morphology of the grown film. The ZnO–CeO2 thin films present high transparency (over 70%) in the visible region of the optical spectrum. - Highlights: • The effects of thermal treatment conditions of ZnO–CeO2 films are investigated. • ZnO–CeO2 films show high transparency in the wavelength range of visible region. • An optical bandgap of 3.32 eV was obtained for the prepared films

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.05.008

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.05.008;
PII
S0040-6090(13)00823-7;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
544
Journal Page Range
p. 44-47
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
6. international conference on technological advances of thin films and surface coatings
Dates
14-17 Jul 2012
Place
Singapore (Singapore)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46090287
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; CERIUM OXIDES; DIFFRACTION; GLASS; GRAIN GROWTH; MICROSTRUCTURE; PEAKS; SOLS; SPECTRA; SUBSTRATES; SURFACES; THIN FILMS; ZINC OXIDES
Descriptors DEC
CERIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COLLOIDS; DISPERSIONS; FILMS; HEAT TREATMENTS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SCATTERING; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.