Determination of bulk etch rate for CR-39 nuclear track detectors using an X-ray fluorescence method

The thickness of a CR-39 detector is determined using an energy dispersive X-ray fluorescence (EDXRF) method of analysis. The method is based on exciting a suitable target and measuring the intensity of its fluorescence X-ray lines passing through the CR-39 sample in a fixed geometry. By properly selecting the target material, the method succeeds in assessing the thickness change of CR-39 detectors etched for different time intervals. The bulk etch rate (Vb) may thus be obtained, which is an important parameter for any solid state nuclear track detector. Application of the EDXRF method yielded a value of Vb = (2.01 ± 0.04) μm h-1 for etching in a 6 N NaOH solution at 75 deg. C. This value agrees with the bulk etch rate of (1.90 ± 0.03) μm h-1, obtained by the conventional mass-change method