Published January 22, 1994 | Version v1
Journal article Metadata-only

Study of the background components for a Ge(HP) detector in environmental radioactivity measurements

Creators

  • 1. Inst. de Fisica Corpuscular, Univ. de Valencia-C.S.I.C., Dept. de Fisica Atomica, Molecular y Nuclear, Valencia (Spain)
  • 2. Dept. of Physics, Veterinary Faculty, Univ. of Extremadura, Caceres (Spain)

Description

A quantitative study of the environmental background components of a gamma-ray spectrum recorded with an unshielded p-type germanium detector has been performed. The contribution of each component to the background spectrum was analyzed separately using Monte Carlo simulation techniques. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
339
Journal Issue
1-2
Journal Page Range
p. 297-301.
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
Conference of the International Committee for Radionuclide Metrology (ICRM) and international symposium on radionuclide metrology and its applications.
Dates
07-11 Jun 1993.
Place
Teddington (United Kingdom).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
25044944
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKGROUND RADIATION; COMPUTERIZED SIMULATION; COSMIC RADIATION; GAMMA DETECTION; GAMMA RADIATION; GAMMA SPECTRA; GERMANIUM; HIGH-PURITY GE DETECTORS; KEV RANGE 100-1000; MEV RANGE 01-10; MONTE CARLO METHOD; P-TYPE CONDUCTORS; RADIATION MONITORING
Descriptors DEC
CALCULATION METHODS; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; KEV RANGE; MATERIALS; MEASURING INSTRUMENTS; METALS; MEV RANGE; MONITORING; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SIMULATION; SPECTRA