Published March 2002 | Version v1
Journal article Metadata-only

Resonator structure with high etching error tolerance for application in HTS filters

Creators

  • 1. Department of Physics, National University of Singapore, Singapore (Singapore)

Description

Dimensional errors introduced during the etching process in the fabrication of a planar microwave circuit can significantly affect the performance of the circuit. Full-wave electromagnetic simulations are used to study the influence of etching errors on the performance of high temperature superconductor (HTS) resonators. Resonators with self-coupling are found to have a high tolerance for etching error. This kind of resonator can be useful for applications in planar HTS resonators and filters. (author)

Availability note (English)

Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/

Additional details

Identifiers

URL
http://www.iop.org/;

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
15
Journal Issue
3
Journal Page Range
p. 327-329
ISSN
0953-2048

Conference

Title
International conference on materials for advanced technologies
Dates
1-6 Jul 2001
Place
Singapore (Singapore)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
33013692
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ETCHING; FABRICATION; HIGH-TC SUPERCONDUCTORS; MICROWAVE EQUIPMENT; SUPERCONDUCTING CAVITY RESONATORS
Descriptors DEC
CAVITY RESONATORS; ELECTRONIC EQUIPMENT; EQUIPMENT; RESONATORS; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; SURFACE FINISHING; TYPE-II SUPERCONDUCTORS