Published 1988 | Version v1
Miscellaneous

Measurement of excited product decay duration in the inelastic scattering reaction Ne + Ge

Creators

Description

The reaction with 20Ne ions in two thick (∼ 1 mm) crystals of Ge of different (100) and (111) orientation and in thin (35 mum) (111) crystal of Ge is investigated. Duration of inelastic reactions is measured by the method based on the shadow effect. Stability of the result to change in a test diagram as well as during separate detection of target- and missile-like products of inelastic collisions is tested. 3 refs.; 2 figs

Additional details

Additional titles

Original title (Russian)
Измерение длительности распада возбужденного продукта реакции неупругого взаимодействия ядер He+Ge

Publishing Information

Imprint Title
Proceedings of 17. All-union meeting on physics of charged particles interaction with crystals
Imprint Pagination
163 p.
Journal Page Range
p. 63-65.
Report number
INIS-SU--124/A

Conference

Title
17. All-union meeting on physics of charged particles interaction with crystals.
Dates
25-27 May 1987.
Place
Moscow (USSR).

Optional Information

Notes
Imprint:L-36614.;Materialy 17. Vsesoyuznogo soveshchaniya po fizike vzaimodejstviya zaryazhennykh chastits s kristallami.