Improved capacitance technique for the determination of series resistance of MS and MIS-type devices for solar cell applications

An improved capacitance technique for the determination of series resistance of MS and MIS-type devices suitable for photovoltaic applications is proposed. The method takes care of the possible effects of interface and bulk defects. The proposed method is examined for a known value of series resistance and the percentage error is calculated. It is seen that, the error in the determination of the series resistance can be minimized over wide range of doping concentration. The method is compared with other well known methods estimating the series resistance of the device. (authors)