Segregation assisted microtwinning during creep of a polycrystalline L12-hardened Co-base superalloy
Creators
- 1. Department of Materials Science and Engineering, Friedrich-Alexander Universität Erlangen-Nürnberg, Martensstraße 5, 91058 Erlangen (Germany)
- 2. Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS (United Kingdom)
Description
A polycrystalline L12-hardened Co-base superalloy was creep deformed at 750 °C. The investigation of the deformed microstructure in the transmission electron microscope revealed microtwinning to be the prevailing deformation mechanism. The detected twins spanned the entire grain and cut through both, γ and γ′. Detailed high-resolution transmission electron microscopy investigations indicated that twin growth takes place by the slip of single a/6 〈112〉 partial dislocations along the twin boundary. Further analysis of the twin boundaries in the γ′ phase revealed segregation of elements known to decrease the stacking fault energy and a local depletion of γ′ forming elements. We propose that this segregation behavior enables subsequent a/6〈112〉 dislocations to easily slip along the twin boundary and further thicken the twins in the process.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2016.10.048Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2016.10.048;
- PII
- S1359-6454(16)30815-1;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 123
- Journal Page Range
- p. 295-304
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48092140
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; HEAT RESISTING ALLOYS; POLYCRYSTALS; SEGREGATION; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING
- Descriptors DEC
- ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; HEAT RESISTANT MATERIALS; MATERIALS; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.