Published January 15, 2017 | Version v1
Journal article

Segregation assisted microtwinning during creep of a polycrystalline L12-hardened Co-base superalloy

  • 1. Department of Materials Science and Engineering, Friedrich-Alexander Universität Erlangen-Nürnberg, Martensstraße 5, 91058 Erlangen (Germany)
  • 2. Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS (United Kingdom)

Description

A polycrystalline L12-hardened Co-base superalloy was creep deformed at 750 °C. The investigation of the deformed microstructure in the transmission electron microscope revealed microtwinning to be the prevailing deformation mechanism. The detected twins spanned the entire grain and cut through both, γ and γ′. Detailed high-resolution transmission electron microscopy investigations indicated that twin growth takes place by the slip of single a/6 〈112〉 partial dislocations along the twin boundary. Further analysis of the twin boundaries in the γ′ phase revealed segregation of elements known to decrease the stacking fault energy and a local depletion of γ′ forming elements. We propose that this segregation behavior enables subsequent a/6〈112〉 dislocations to easily slip along the twin boundary and further thicken the twins in the process.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2016.10.048

Additional details

Identifiers

DOI
10.1016/j.actamat.2016.10.048;
PII
S1359-6454(16)30815-1;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
123
Journal Page Range
p. 295-304
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48092140
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CRYSTAL GROWTH; HEAT RESISTING ALLOYS; POLYCRYSTALS; SEGREGATION; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING
Descriptors DEC
ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; HEAT RESISTANT MATERIALS; MATERIALS; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.