Published 1989 | Version v1
Book

The microwave power dependence of low field microwave loss and flux trapping in Hf doped YBa2Cu3O7

  • 1. Dept. of Physics, Indian Institute of Technology, Kanpur 208 016 (India)

Description

The hafnium doped YBaCuO ceramics are studied by EPR and low field microwave loss measurements. Microwave loss (ML) signal saturates at very low microwave power as compared to EPR signal of Cu2+. It is shown that the amount of the trapped flux is proportional to the amount of impurity phase in the material. The lower critical field, Hc1, is found to be 7 mT at 77 K from these studies. Diminishing microwave loss with increasing impurity phases is attributed to the increasing Jc in these samples

Additional details

Publishing Information

Publisher
Elsevier Science Pub. Co., Inc.
Imprint Place
New York, NY (USA)
Imprint Title
Proceedings of the international conference on materials and mechanisms of superconductivity. High temperature superconductors II. Part 1-2
Imprint Pagination
1744 p.
Journal Page Range
p. 1573-1574.

Conference

Title
International conference on materials and mechanisms of superconductivity - high-temperature superconductors II.
Dates
23-28 Jul 1989.
Place
Stanford, CA (USA).

Optional Information

Secondary number(s)
CONF-890718--.