Irradiation temperature dependence of swift heavy ion induced defects in oxide superconductor EuBa2Cu3Oy
Description
Thin films of oxide superconductor EuBa2Cu3Oy have been irradiated with 80-90 MeV I ions at various temperatures (281, 100, 50 and 12 K). To decide the diameter and the inside-resistivity (resistivity inside the columnar defect), the ion-fluence dependence of electrical resistivity was measured in-situ at 100 and 281 K. The irradiation at 281 K results in the production of columnar defects with much higher inside-resistivity and smaller diameter than those produced by irradiation at 100 K. The difference in the defect structure between these two irradiations can be explained as due to the difference in stability of defects primarily produced by electronic excitation. The result of annealing the sample up to room temperature after irradiation at 100 K supports the above explanation. The irradiation at 50 and 12 K, which are below the superconducting transition temperature, Tc, does not show any difference in irradiation effect from the irradiation above Tc. Effects of irradiation at 100 K and subsequent annealing up to room temperature on the Hall coefficient have also been studied
Additional details
Identifiers
- PII
- S0168583X99010083;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 164-165
- Journal Issue
- 4
- Journal Page Range
- p. 384-390
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33047652
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMBIENT TEMPERATURE; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; HALL EFFECT; HEAVY IONS; RADIATION EFFECTS; SUPERCONDUCTORS; THIN FILM STORAGE DEVICES; TRANSITION TEMPERATURE
- Descriptors DEC
- CHARGED PARTICLES; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; IONS; MEMORY DEVICES; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.