Development of a new x-ray residual stress analyzer for field use and its application
Creators
- 1. Mitsubishi Heavy Industries Ltd., Nagasaki (Japan). Nagasaki Technical Inst.
Description
This paper presents a newly developed X-ray residual stress analyzer for field use which is portable and capable of nondestructive measurement of residual stress in large structures. This analyzer consists of four components: an X-ray generator, a goniometer, a heat exchanger and an electronic circuit panel. It has the same high measuring accuracy as the conventional analyzers and has adopted automatic control systems as far as possible for smooth on-site measuring operation. The analyzer is being applied to the measurement of residual stress in large-sized structure, providing its usefulness for the improvement of the dependability of actual products. It is expected that the nondestructive residual stress measuring method using X-ray will be utilized in a wider practical range. (auth.)
Additional details
Publishing Information
- Journal Title
- Mitsubishi Juko Giho
- Journal Volume
- 14
- Journal Issue
- 1
- Series
- Mitsubishi Juko Giho.
- Journal Page Range
- 13-18
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 8343837
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ANGULAR DISTRIBUTION; GONIOMETERS; NONDESTRUCTIVE TESTING; PERFORMANCE TESTING; RESIDUAL STRESSES; SPECIFICATIONS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; DISTRIBUTION; MATERIALS TESTING; MEASURING INSTRUMENTS; SCATTERING; STRESSES; TESTING