High numerical aperture zone plates using high orders of diffraction
Creators
- 1. Institut fuer Roentgenphysik, Georg-August-Universitaet Goettingen, Geiststrasse 11, D-37073 Goettingen (Germany)
Description
The implementation of laboratory X-ray microscopes with isotropic sources like laser generated plasmas requires condenser elements which collect photons from large solid angles, match the aperture of the micro zone plate objective to insure high spatial frequency transfer and allow to work at different wavelengths. All these requirements can be met by a zone plate condenser used in a high order of diffraction. Recent progress in nanostructuring allows the production of galvanoforms with aspect ratios >14, where the structure size is below 90 nm. A first linear nickel test zone plate with an outermost zone width of 75 nm and 500 nm high zones showed a diffraction efficiency of 1% at 3.4 nm wavelength in the sixth order of diffraction, which is significantly above the value predicted by the theory of thin gratings. These results open the way towards zone plate condensers with numerical apertures well beyond those of first order diffractive elements
Additional details
Identifiers
- DOI
- 10.1063/1.1291228;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 507
- Journal Issue
- 1
- Journal Page Range
- p. 662-667
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on X-ray microscopy
- Dates
- 2-6 Aug 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35070040
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- APERTURES; ASPECT RATIO; EFFICIENCY; LASER-PRODUCED PLASMA; MICROSCOPES; NICKEL; OPTIMIZATION; PHOTONS; PLATES; SCANNING ELECTRON MICROSCOPY; WAVELENGTHS; WIDTH; X RADIATION; X-RAY DIFFRACTION; ZONES
- Descriptors DEC
- BOSONS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; IONIZING RADIATIONS; MASSLESS PARTICLES; METALS; MICROSCOPY; OPENINGS; PLASMA; RADIATIONS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2000 American Institute of Physics.