Published 2023 | Version v1
Report

XRISM and atomic processes in plasmas

  • 1. NASA Goddard Space Flight Center (United States)

Description

The X-ray Imaging and Spectroscopy Mission (XRISM) is a Collaborative Mission jointly developed by NASA and the Japanese Space Agency (JAXA), with the European Sapace Agency (ESA) participation. It will have Two instruments: Resolve: a soft X-ray (0.3–12 keV) spectrometer providing non-dispersive high-resolution X-ray spectroscopy; and Xtend: a 40 arcminute field of view soft X-ray imager. XRISM is scheduled to launch from Japan in May of 2023. The mission is to recover science lost with the demise of Hitomi in 2016. After a 9-month calibration and performance verification phase, the rest of the mission lifetime will be for General Observers worldwide. In this talk I will review the capabilities of XRISM, and some of the science goals for the observations to be carried out during the performance verification phase. I will highlight the fundamental atomic physics knowledge needed in order to interpret XRISM observational data, and also how this impacts the XRISM science. (author)

Part of:
21st Atomic Processes in Plasmas Conference. Book of Abstracts

Additional details

Publishing Information

Imprint Title
21st Atomic Processes in Plasmas Conference. Book of Abstracts
Imprint Pagination
183 p.
Journal Page Range
p. 32
Report number
INIS-XA--23M0899

Conference

Title
21. Atomic Processes in Plasmas Conference
Dates
15-19 May 2023
Place
Vienna (Austria)

INIS

Country of Publication
International Atomic Energy Agency (IAEA)
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54097622
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC PHYSICS; CALIBRATION; KEV RANGE; PERFORMANCE; PLASMA; RESOLUTION; SOFT X RADIATION; SPECTROMETERS; X-RAY SPECTROSCOPY
Descriptors DEC
ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; MEASURING INSTRUMENTS; PHYSICS; RADIATIONS; SPECTROSCOPY; X RADIATION

Optional Information