Published December 30, 1975
| Version v1
Patent
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Ion beam apparatus with separately replaceable elements
Creators
Description
In an ion beam apparatus wherein ions are generated by the collision of electrons from a filamentary emitter with gas atoms in the vicinity of an electron-attracting grid structure, with subsequent extraction of the ions so generated from the vicinity of the grid structure and the focusing of these ions into a beam by an electrostatic lens system, a new way of mounting the ion extractor and the electrostatic lens system is disclosed which facilitates the removal and replacement of the filament and the grid structure. A configuration of the grid structure is also disclosed which optimizes the profile and the current density of the ion beam
Availability note (English)
MF available from INIS under the Report Number.Files
7253157.pdf
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Additional details
Additional titles
- Augmented title (English)
- Patent
Publishing Information
- Imprint Pagination
- 10 p.
- IPC:
- Int. Cl.G01k1/08.
- IPC
- Int. Cl.G01k1/08.
- Patent number
- US patent document 3,930,163
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7253157
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ARGON IONS; BEAM OPTICS; BEAM PRODUCTION; ION BEAMS; ION SOURCES; SPUTTERING
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS