Published October 2021 | Version v1
Journal article

On the nature of photosensitivity gain in Ga2O3 Schottky diode detectors: Effects of hole trapping by deep acceptors

  • 1. National University of Science and Technology MISiS, Moscow 119049 (Russian Federation)
  • 2. Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Science, Moscow Region 142432 (Russian Federation)

Description

Highlights: • Deep acceptor states introduced into n-Ga2O3 by irradiation. This enables us to control, the density of these states. • Measurement of current collection efficiency show the capture of holes by deep acceptors gives rise to a decrease in Schottky barrier height and an increase of the electron current flow responsible for the observed high gain. • This mechanisms explains the high photoconductive gains reported in the literature for Ga2O3 photodetectors. • The reported observation could form a basis for improvement of photosensitivity of Ga2O3-based solar-blind photodetectors. -- Abstract: Lightly n-type doped Ga2O3 layers grown by Halide Vapor Phase Epitaxy (HVPE) on bulk n+-Ga2O3 substrates were subjected to irradiation with fast reactor neutrons, 20 MeV protons, or treatment in high ion density Ar plasma. These treatments lead to a marked increase in the concentration of deep acceptors in the lower half of the bandgap. These acceptors have optical ionization thresholds near 2.3 eV and 3.1 eV. There is a simultaneous strong enhancement of the photocurrent of Schottky diodes fabricated on these layers in the UV spectral range, and a large increase in the Electron Beam Induced Current (EBIC) collection efficiency. The gain in photocurrent at −10 V reached 18 times for neutron and proton irradiated samples, and 104 times for the plasma treated samples. Similar increases in gain were observed in the EBIC current collection efficiency for beam energy 4 keV. With such beam energy, the electron–hole pairs are generated well within the space charge region. The results are explained by assuming that the capture of photoinduced or electron-beam-induced holes by the deep acceptors gives rise to a decrease in the effective Schottky barrier height and an increase of the electron current flow that is responsible for the observed high gain. The reported observation could form a basis for radical improvement of photosensitivity of Ga2O3-based solar-blind photodetectors. However, the photocurrent build-up and decay times in this mechanism are inherently long, on the order of some seconds.

Additional details

Identifiers

DOI
10.1016/j.jallcom.2021.160394;
PII
S092583882101803X;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
879
Journal Page Range
vp.
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2021 Elsevier B.V. All rights reserved.