Published April 1, 1991 | Version v1
Journal article

A simplex optimization method for the precise determination of symmetry-constrained lattice constants from diffractometer data

  • 1. Wisconsin Univ., Milwaukee (United States). Dept. of Chemistry

Description

A method for the determination of a symmetry-constrained least-squares orientation matrix and unit cell is described. The method retains the simplicity of early iterative techniques since it avoids the use of cumbersome constraining equations resulting from the application of Lagrange multipliers, yet it does not require the evaluation of numerical derivatives. The straightforward nature of simplex optimization makes the algorithm extremely easy to program in Fortran, Pascal and Basic. (orig.)

Additional details

Publishing Information

Journal Title
Journal of Applied Crystallography
Journal Volume
24
Journal Issue
2
Series
J. Appl. Crystallogr.
Journal Page Range
91-95
ISSN
0021-8898
CODEN
JACGA

INIS

Country of Publication
Denmark
Country of Input or Organization
Denmark
INIS RN
23000555
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALGORITHMS; COMPUTER CODES; CRYSTAL STRUCTURE; LATTICE PARAMETERS; LEAST SQUARE FIT; NUMERICAL SOLUTION; SYMMETRY; SYMMETRY GROUPS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MAXIMUM-LIKELIHOOD FIT; SCATTERING

Optional Information

Contract/Grant/Project number
Grant NSF CHE-88-52705