Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidation

Auger electron spectroscopy depth profiling was applied to characterize the Fe-oxide layers prepared by low temperature oxidation of Fe electromagnetic sheets produced on an industrial line for applications in the field of electrical motors. In addition the surface morphology, layer composition and layer structure were analysed by electron microscopy, energy dispersive X-ray spectroscopy and X-ray diffraction techniques. We found that the oxide layers on Fe-sheets with good adhesion between the oxide layer and Fe-substrate, consist mainly of magnetite and to a smaller extent of haematite; the layers are typically thinner than 1 μm and the interface between the oxide layer and the Fe-substrate is relatively broad, i.e. up to 0.3 μm. On the contrary, a decrease of adhesion between the oxide layer and the Fe-substrate was found when the layer is thicker than 1 μm and the layer/substrate interface is narrow and contaminated by foreign elements