Published December 2010 | Version v1
Journal article

An SLM-based Shack–Hartmann wavefront sensor for aberration correction in optical tweezers

  • 1. Department of Physics and Astronomy, SUPA, University of Glasgow, G12 8QQ (United Kingdom)
  • 2. Institute of Photonics, SUPA, University of Strathclyde, Glasgow G4 0NW (United Kingdom)

Description

Holographic optical tweezers allow the creation of multiple optical traps in 3D configurations through the use of dynamic diffractive optical elements called spatial light modulators (SLMs). We show that, in addition to controlling traps, the SLM in a holographic tweezers system can be both the principal element of a wavefront sensor and the corrective element in a closed-loop adaptive optics system. This means that aberrations in such systems can be estimated and corrected without altering the experimental setup. Aberrations are estimated using the Shack–Hartmann method, where an array of spots is projected into the sample plane and the distortion of this array is used to recover the aberration. The system can recover aberrations of up to ten wavelengths peak–peak, and is sensitive to aberrations much smaller than a wavelength. The spot pattern could also be analysed by eye, as a tool for aligning the system

Availability note (English)

Available from http://dx.doi.org/10.1088/2040-8978/12/12/124004

Additional details

Identifiers

DOI
10.1088/2040-8978/12/12/124004;
PII
S2040-8978(10)54534-8;

Publishing Information

Journal Title
Journal of Optics (Online)
Journal Volume
12
Journal Issue
12
Journal Page Range
[6 p.]
ISSN
2040-8986

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45018987
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
CORRECTIONS; HOLOGRAPHY; OPTICS; SCANNING LIGHT MICROSCOPY; SENSORS; VISIBLE RADIATION; WAVELENGTHS
Descriptors DEC
ELECTROMAGNETIC RADIATION; MICROSCOPY; OPTICAL MICROSCOPY; RADIATIONS