Published July 31, 2008
| Version v1
Journal article
Thermodynamic analysis and growth of ZrO2 by chloride chemical vapor deposition
- 1. Materials Science and Technology Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831 (United States)
- 2. University of Louisville, Louisville, KY 40292 (United States)
- 3. Department of Chemical Engineering, University of Florida, Gainesville, FL 32611 (United States)
Description
Equilibrium calculations were used to optimize conditions for the chemical vapor deposition (CVD) of zirconia. The results showed zirconia formation would occur at high oxygen to zirconium atomic ratios (> 4), low hydrogen to carbon ratios (< 10), low pressures (< 105 Pa) and high temperatures (> 800 deg. C). Using these calculations as a guide, single-phase monoclinic zirconia coatings were deposited onto 2-cm diameter α-alumina substrates. The maximum growth rate achieved was 2.46 mg cm-2 h-1
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2007.11.020Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2007.11.020;
- PII
- S0040-6090(07)01874-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 18
- Journal Page Range
- p. 6133-6139
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40005856
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; CARBON; CHEMICAL VAPOR DEPOSITION; CHLORIDES; COATINGS; CRYSTAL GROWTH; MONOCLINIC LATTICES; TEMPERATURE RANGE 1000-4000 K; ZIRCONIUM; ZIRCONIUM OXIDES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL COATING; CHLORINE COMPOUNDS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEPOSITION; ELEMENTS; HALIDES; HALOGEN COMPOUNDS; METALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.