Published September 28, 2009
| Version v1
Journal article
Minimal textures in seesaw mass matrices and their low and high energy phenomenology
- 1. Harish-Chandra Research Institute, Chhatnag Road, Jhunsi, Allahabad 211019 (India)
- 2. Physical Research Laboratory, Navrangpura, Ahmedabad 380009 (India)
- 3. Max-Planck-Institut fuer Kernphysik, Postfach 103980, D-69029 Heidelberg (Germany)
Description
In an attempt to find minimal scenarios we study the implications of Dirac and Majorana mass matrices with texture zeros within the type I seesaw mechanism. For the Dirac mass matrices we consider 5 zero textures which we show to be the most minimal form that can successfully account for low energy phenomenology if the Majorana mass matrices are chosen minimal as well. For those, we consider both diagonal and even more minimal non-diagonal forms. The latter can be motivated e.g. by simple U(1) flavour symmetries and have two degenerate eigenvalues. We classify the allowed textures and discuss the ramifications for leptogenesis and lepton flavour violation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physletb.2009.08.056Additional details
Identifiers
- DOI
- 10.1016/j.physletb.2009.08.056;
- arXiv
- arXiv:0905.2739v2;
- PII
- S0370-2693(09)01032-6;
Publishing Information
- Journal Title
- Physics Letters. Section B
- Journal Volume
- 680
- Journal Issue
- 3
- Journal Page Range
- p. 255-262
- ISSN
- 0370-2693
- CODEN
- PYLBAJ
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41055626
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- EIGENVALUES; FLAVOR MODEL; LEPTONS; MASS; MATRICES; PARTICLE PRODUCTION; U-1 GROUPS; UNITARY SYMMETRY
- Descriptors DEC
- COMPOSITE MODELS; ELEMENTARY PARTICLES; FERMIONS; LIE GROUPS; MATHEMATICAL MODELS; PARTICLE MODELS; QUARK MODEL; SYMMETRY; SYMMETRY GROUPS; U GROUPS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.