5 years of ambient pressure photoelectron spectroscopy (APPES) at the Swiss Light Source (SLS)
- 1. Laboratory for Surface Science and Technology, Department of Materials, ETH Zürich, CH-8093, Zurich (Switzerland)
- 2. Department of Chemistry and Biomolecular Sciences, and Centre for Catalysis Research and Innovation, University of Ottawa, Ottawa, Ontario, K1N 6N5 (Canada)
- 3. Measurement Science and Standards, National Research Council Canada, Ottawa, Ontario K1A 0R6 (Canada)
Description
Highlights: • A review of the ongoing research using the APPES endstation of the Swiss Light Source is presented. • Research interests include the liquid-vapor, liquid-nanoparticle and vapor-solid interfaces. • An outlook to the next five years of research at the Swiss Light Source is presented. - Abstract: In March of 2012 an endstation dedicated to ambient pressure photoelectron spectroscopy (APPES) was installed at the Swiss Light Source (SLS) synchrotron radiation facility on the campus of the Paul Scherrer Institute (PSI). The endstation is mobile and operated at the vacuum ultraviolet (VUV), Surfaces/Interfaces: Microscopy (SIM) and Phoenix beamlines, which together afford a nearly continuous photon energy range from 5−8000 eV. This broad energy range is by far the widest available to a single currently operational APPES endstation. During its first five years of operation this endstation has been used to address challenging fundamental problems in the areas of soft-matter colloidal nanoscience, environmental science and energy storage—research that encompasses the liquid-nanoparticle, liquid-vapor (or vacuum) and solid-vapor interfaces. Here we present select highlights of these results and offer an outlook to the next five years of APPES research at the SLS.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2017.01.003Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2017.01.003;
- PII
- S0368-2048(16)30197-9;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 216
- Journal Page Range
- p. 1-16
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48093253
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; FAR ULTRAVIOLET RADIATION; FINE STRUCTURE; ION MICROPROBE ANALYSIS; LAYERS; LIQUIDS; MASS SPECTROSCOPY; MICROSCOPY; NANOPARTICLES; NANOSTRUCTURES; PHOTONS; SURFACES; SWISS LIGHT SOURCE; SYNCHROTRON RADIATION; SYNCHROTRONS; VAPORS; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- ACCELERATORS; BOSONS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FLUIDS; GASES; IONIZING RADIATIONS; MASSLESS PARTICLES; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; PARTICLES; PHOTOELECTRON SPECTROSCOPY; RADIATION SOURCES; RADIATIONS; SPECTROSCOPY; SYNCHROTRON RADIATION SOURCES; ULTRAVIOLET RADIATION
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.