FAZA device for investigation of multiple emission of intermediate mass fragments in nucleus-nucleus interactions
Description
The 4π detector for the investigation of multiple emission of the intermediate mass fragment in nucleus-nucleus collisions is described. The device includes 64 scintillation counters with thin layers of CsI(Tl) and five telescope-spectrometers of fragments. These telescopes consist of a flat proportional counter, ionization chamber and Si(Au) detector. The paper includes also the data obtained with the use of one module of the device. The module was composed of telescope-spectrometer and two scintillation counters with thin (∼ 12 mg/cm2) layers of CsI(Tl). The experiments were performed on 4He and 12C beams (3.6 GeV/nucleon). The yield of the fragments in a Zf function of atomic number when irradiating Ta with 4He beam was measured. 17 refs.; 11 figs
Availability note (English)
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22061093.pdf
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Additional details
Additional titles
- Subtitle (English)
- Design, model testing
- Original title (Russian)
- FAZA - ustanovka dlya issledovaniya mnozhestvennoj ehmissii fragmentov promezhutochnoj massy v yaderno-yadernykh vzaimodejstviyakh
- Original subtitle (Russian)
- Konstruktsiya, ehksperimenty na maketakh.
Publishing Information
- Imprint Pagination
- 11 p.
- Report number
- JINR-R--7-89-29
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 22061093
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- ALPHA REACTIONS; CARBON 12 REACTIONS; ENERGY DEPENDENCE; GEV RANGE 10-100; INTERMEDIATE MASS NUCLEI; MULTIPARTICLE SPECTROMETERS; MULTIPLICITY; NUCLEAR FRAGMENTATION; NUCLEAR REACTION YIELD; PERFORMANCE TESTING; SCALE MODELS; SI SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS; TANTALUM 181 TARGET; TELESCOPE COUNTERS
- Descriptors DEC
- ENERGY RANGE; GEV RANGE; HEAVY ION REACTIONS; MEASURING INSTRUMENTS; NUCLEAR REACTIONS; NUCLEI; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SPECTROMETERS; STRUCTURAL MODELS; TARGETS; TESTING