AFM images of aluminium probe reinforced with Si C whiskers, palladium sample and Si-Si C sample

Atomic Force Microscopy (AFM) is a relatively new technique for sample topography investigations down to atomic scale with very high resolution. It makes magnetic, electrostatic, frictional and adhesive forces accessible on a scale not possible before. This is enabled by the existing forces between the sample and the force sensor. High sensitivity of AFM is used to produce exquisitely precise measurements of vertical position of the atoms in Angstrom (A) range, while the gap between the tip and surface maintains in the range of less then 10 A. This study was included in the projects at the lzfP-FhG1. It concerns the application of Nano scope Ill1 AFM, installed in the lzfP-FhG, in investigating the surface properties of a palladium sample, Si-Si C sample and an aluminium probe reinforced with Si C whiskers. It showed that certain improvements of the software governing the AFM, such as exact positioning of the cantilever relatively to the sample, precise measurements of distances on the probe, measuring the depth and length of a crack (definition of a crack), capability of exact counting of the cracks in a certain area, as well as calculating the part of the area occupied by cracks, are necessary. (Author)