Pendellösung interferometry by using pulsed neutrons

Pendellösung interferometry is one of the technique for accurate determination of the structure factors of crystals. Observation method of Pendellösung fringes by using pulsed cold neutrons and the time-of-flight analysis were established. We measured the nuclear scattering length of silicon by the Pendellösung fringes with pulsed neutrons as ($4.125\pm 0.003\left(\mathrm{stat.}\right)\pm 0.028\left(\mathrm{syst.}\right)$). This indicates the applicability of Pendellösung interferometry at high-intensity pulsed neutron facilities for various precision measurements.