Published September 15, 2011 | Version v1
Journal article

Multi-scale random sets: from morphology to effective properties and to fracture statistics

  • 1. Centre de Morphologie Mathematique, Mathematiques et Systemes, Mines ParisTech 35 rue Saint-Honore, F77300 Fontainebleau (France)

Description

Complex microstructures in materials often involve multi-scale heterogeneous textures, modelled by random sets derived from Mathematical Morphology. Starting from 2D or 3D images, a complete morphological characterization by image analysis is performed, and used for the identification of a model of random structure. From morphological models, simulations of realistic microstructures are introduced in a numerical solver to compute appropriate fields (electric, elastic stress or strain, ...) and to estimate the effective properties by numerical homogenization, accounting for scale dependent statistical fluctuations of the fields. Our approach is illustrated by various examples of multi-scale models: Boolean random sets based on Cox point processes and various random grains (spheres, cylinders), showing a very low percolation threshold, and therefore a high conductivity or high elastic moduli for a low volume fraction of a second phase. Multiscale Cox point processes are also a source of instructive models of fracture statistics, such as multiscale weakest link models.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/319/1/012013

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
319
Journal Issue
1
Journal Page Range
[11 p.]
ISSN
1742-6596

Conference

Title
Continuum Models and Discrete Systems Symposia
Acronym
CMDS-12
Dates
21-25 Feb 2011
Place
Kolkata (India)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43085697
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CYLINDERS; ELASTICITY; ELECTRIC FIELDS; FLUCTUATIONS; FRACTURES; IMAGE PROCESSING; MICROSTRUCTURE; MORPHOLOGY; RANDOMNESS; SCALE MODELS; SPHERES; STATISTICS; STRAINS; STRESSES; TEXTURE
Descriptors DEC
FAILURES; MATHEMATICS; MECHANICAL PROPERTIES; PROCESSING; STRUCTURAL MODELS; VARIATIONS