Multi-scale random sets: from morphology to effective properties and to fracture statistics
Creators
- 1. Centre de Morphologie Mathematique, Mathematiques et Systemes, Mines ParisTech 35 rue Saint-Honore, F77300 Fontainebleau (France)
Description
Complex microstructures in materials often involve multi-scale heterogeneous textures, modelled by random sets derived from Mathematical Morphology. Starting from 2D or 3D images, a complete morphological characterization by image analysis is performed, and used for the identification of a model of random structure. From morphological models, simulations of realistic microstructures are introduced in a numerical solver to compute appropriate fields (electric, elastic stress or strain, ...) and to estimate the effective properties by numerical homogenization, accounting for scale dependent statistical fluctuations of the fields. Our approach is illustrated by various examples of multi-scale models: Boolean random sets based on Cox point processes and various random grains (spheres, cylinders), showing a very low percolation threshold, and therefore a high conductivity or high elastic moduli for a low volume fraction of a second phase. Multiscale Cox point processes are also a source of instructive models of fracture statistics, such as multiscale weakest link models.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/319/1/012013Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 319
- Journal Issue
- 1
- Journal Page Range
- [11 p.]
- ISSN
- 1742-6596
Conference
- Title
- Continuum Models and Discrete Systems Symposia
- Acronym
- CMDS-12
- Dates
- 21-25 Feb 2011
- Place
- Kolkata (India)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43085697
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CYLINDERS; ELASTICITY; ELECTRIC FIELDS; FLUCTUATIONS; FRACTURES; IMAGE PROCESSING; MICROSTRUCTURE; MORPHOLOGY; RANDOMNESS; SCALE MODELS; SPHERES; STATISTICS; STRAINS; STRESSES; TEXTURE
- Descriptors DEC
- FAILURES; MATHEMATICS; MECHANICAL PROPERTIES; PROCESSING; STRUCTURAL MODELS; VARIATIONS