Published April 1, 2005
| Version v1
Journal article
Test of ATLAS SCT barrel modules with Nd:YAG laser
Creators
- 1. Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Ten'nodai, Tsukuba, Ibaraki 305-8571 (Japan)
- 2. High Energy Accelerator Research Organization (KEK), Oho 1-1, Tsukuba, Ibaraki 305-0801 (Japan)
- 3. Kyoto University of Education, Fukakusa-Fujimori, Kyoto 612-8522 (Japan)
- 4. Department of Physical Science, Okayama University, 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan)
- 5. Department of Physical Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan)
Description
As a part of the quality assurance procedure of the ATLAS SCT (Semiconductor Tracker) barrel modules, the response of the microstrip detector is measured by injecting focused Nd:YAG laser at each strip. The test is sensitive to sensor originated problems and a cross check to the results obtained from the electrical tests performed with the test pulse system implemented in the readout ASICs. Combining these results with the probing results obtained by the silicon sensor manufacturer, we verified the reliabilities of these tests and classified the type of defects for overall performance evaluation of the modules
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2005.01.048;
- PII
- S0168-9002(05)00060-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 541
- Journal Issue
- 1-2
- Journal Page Range
- p. 122-129
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international symposium on development and application of semiconductor tracking detectors
- Acronym
- STD 5
- Dates
- 14-17 Jun 2004
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033554
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATLAS SUPERCONDUCTING LINAC; DEFECTS; LASERS; MANUFACTURERS; PERFORMANCE; PULSES; QUALITY ASSURANCE; RELIABILITY; SEMICONDUCTOR MATERIALS; SI MICROSTRIP DETECTORS; SILICON
- Descriptors DEC
- ACCELERATORS; ELEMENTS; HEAVY ION ACCELERATORS; HILACS; LINEAR ACCELERATORS; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.