Structural and optical properties of Cu2ZnSnS4 synthesized by ultrasonic assisted sol-gel method
- 1. Department of Applied Physics, Indian Institute of Technology (Indian School of Mines), Dhanbad 826004 (India)
Description
Cu2ZnSnS4 (CZTS) nanocrystals were synthesized by a simple ultrasonic assisted sol-gel method using two different solvents. Structure and purity of the phase formed were investigated using X-ray diffraction (XRD) and Raman measurements. The average crystallite size were estimated by using Scherrer's formula and found to be 2.09 and 7.15 nm. Raman study reveals the kesterite-phase of prepared samples. The influence of solvent in the morphologies of prepared samples was investigated by field emission scanning electron microscopy (FESEM). Ultraviolet–visible–near-infrared absorption measurement was carried out to calculate the optical band gap of samples. Oxidation state of the constitute elements of as-prepared samples were investigated by X-ray photoelectron spectroscopy (XPS) analysis and the results are in good agreement with the literature. The surface area and pore volume were estimated after analysis of nitrogen adsorption-desorption isotherm curves and found to be 16.5 m2/gm and 0.01 cm3/gm respectively.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2018.02.013Additional details
Identifiers
- DOI
- 10.1016/j.physb.2018.02.013;
- PII
- S0921452618301212;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 537
- Journal Page Range
- p. 111-115
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50028827
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADSORPTION ISOTHERMS; CDZNTE SEMICONDUCTOR DETECTORS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SURFACE AREA; TIN SULFIDES; ULTRASONIC WAVES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ISOTHERMS; MEASURING INSTRUMENTS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SOUND WAVES; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; SURFACE PROPERTIES; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.