Published 1999
| Version v1
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The microelectronic and photonic test bed RISC processor and DRAM memory stack experiments
Creators
- 1. Naval Research Laboratory, Space Systemes Development Dept., Washington, DC (United States)
Description
This paper reports on the on-orbit data obtained from the MPTB RISC Processor Experiment, containing three Integrated Device Technologies R3081 processors. During operations, nine SEUs were observed in the processors, and four SEUs were observed in the memory and/or support circuitry. (authors)
Availability note (English)
Available from INIS in electronic formFiles
34078102.pdf
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(91.1 kB)
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Additional details
Additional titles
- Original title (English)
- Banc de test de composants electroniques et optoelectroniques MPTB: retour d'experience en vol sur les cartes ''memoire de masse'' et processeurs RISC
Publishing Information
- Imprint Pagination
- [2 p.]
- Report number
- INIS-FR--2108
Conference
- Title
- 5. European conference on radiation and its effects on components and systems
- Original Conference Title
- 5. congres europeen les radiations et leurs effets sur les composants et les systemes
- Dates
- 13-17 Sep 1999
- Place
- Abbaye de Fontevraud (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34078102
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARRAY PROCESSORS; MICROPROCESSORS; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS; SPACE FLIGHT
- Descriptors DEC
- COMPUTERS; DIGITAL COMPUTERS; ELECTRONIC CIRCUITS; MICROELECTRONIC CIRCUITS; RADIATION EFFECTS; TESTING