Published 2022 | Version v1
Book Metadata-only

Influence of microstructure on the hardness and electrical conductivity of CuCrZr alloy submitted to ECAP followed by aging and swaging

Creators

  • 1. Instituto Militar de Engenharia (Brazil). Seção de Engenharia dos Materiais

Description

no abstract available

Part of:
Proceedings of the 20. Brazil MRS Meeting

Additional details

Identifiers

URL
https://www.sbpmat.org.br/20encontro/proceedings/pdfs/plenary/4G2N.pdf;

Publishing Information

Publisher
SBPMat
Imprint Place
Rio de Janeiro, RJ (Brazil)
ISBN
978-85-63273-47-5
Imprint Title
Proceedings of the 20. Brazil MRS Meeting
Imprint Pagination
[1793 p.]
Journal Page Range
1 p.

Conference

Title
20. Brazil MRS Meeting
Dates
25-29 Sep 2022
Place
Foz do Iguacu, PR (Brazil)

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
54064676
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
BACKSCATTERING; CHROMIUM ALLOYS; COPPER ALLOYS; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; GRAIN SIZE; MICROSTRUCTURE; VICKERS HARDNESS; X-RAY DIFFRACTION; ZIRCONIUM ALLOYS
Descriptors DEC
ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SIZE; TRANSITION ELEMENT ALLOYS

Optional Information