Photoelectrochemical Characteristics Of α-Fe2O3 Nanocrystalline Semiconductor Thin Film
- 1. Chinese Academy of Sciences, Jilin, Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry (China)
- 2. Jilin University, Department of Chemistry (China)
Description
α-Fe2O3 single crystal thin films have been prepared from 45 nm diameter colloid. These thin nanocrystalline films exhibit a typical behavior of n-type semiconductor material because of the anodic photocurrent generation. The anodic photocurrent response upon illumination and the reversal spike of cathodic current upon the light switched off suggests that the electrons can flow in both directions and no space charge layer exists at the thin film/electrolyte interface. The decreased photocurrent responses of thicker films can be explained by the electric resistance effect and recombination effect. Moreover, the thicker film will lead to a poor photocurrent response for short wavelength light. Considering the use of sunlight, the thin film thickness should be controlled to an optimal value
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nanoparticle Research
- Journal Volume
- 2
- Journal Issue
- 2
- Journal Page Range
- p. 191-198
- ISSN
- 1388-0764
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39092422
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COLLOIDS; ELECTROLYTES; ELECTRONS; INTERFACES; IRON OXIDES; MONOCRYSTALS; NANOSTRUCTURES; SEMICONDUCTOR MATERIALS; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CRYSTALS; DISPERSIONS; ELEMENTARY PARTICLES; FERMIONS; FILMS; IRON COMPOUNDS; LEPTONS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2000 Kluwer Academic Publishers