Machine Vision-based Defect Detection Using Deep Learning Algorithm
- 1. Seoul National University of Science and Technology, Seoul (Korea, Republic of)
Description
Currently, there are numerous methods for detecting product defects by combining deep learning and machine vision, which are the core technologies of the fourth industrial revolution. In this study, we have developed a software that can identify defects, based on deep learning and machine vision, using the Keras open source library. The software was used to determine the defect based on an image of the regular product, and then identify its location using probability distribution. In addition, three verification experiments were carried out, the first which is a basic verification experiment, using an image produced by an image editor, the second, using an assembly block; and finally, a semi-real application experiment using an electric bread-board. Through these experiments, it was confirmed that machine vision-based defect detection system using deep learning algorithm could identify the defects and pinpoint their locations
Additional details
Publishing Information
- Journal Title
- Journal of the Korean Society for Nondestructive Testing
- Journal Volume
- 40
- Journal Issue
- 1
- Journal Series
- 7 refs, 8 figs
- Journal Page Range
- p. 47-52
- ISSN
- 1225-7842
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 51113134
- Subject category
- ENGINEERING;
- Quality check status
- Yes
- Descriptors DEI
- ALGORITHMS; ARTIFICIAL INTELLIGENCE; BREAD; COMPUTER CODES; DEFECTS; DETECTION; DISTRIBUTION; IMAGES; LEARNING; LIBRARIES; VERIFICATION; VISION;
- Descriptors DEC
- FOOD; MATHEMATICAL LOGIC;