Published February 2020 | Version v1
Journal article

Machine Vision-based Defect Detection Using Deep Learning Algorithm

  • 1. Seoul National University of Science and Technology, Seoul (Korea, Republic of)

Description

Currently, there are numerous methods for detecting product defects by combining deep learning and machine vision, which are the core technologies of the fourth industrial revolution. In this study, we have developed a software that can identify defects, based on deep learning and machine vision, using the Keras open source library. The software was used to determine the defect based on an image of the regular product, and then identify its location using probability distribution. In addition, three verification experiments were carried out, the first which is a basic verification experiment, using an image produced by an image editor, the second, using an assembly block; and finally, a semi-real application experiment using an electric bread-board. Through these experiments, it was confirmed that machine vision-based defect detection system using deep learning algorithm could identify the defects and pinpoint their locations

Additional details

Publishing Information

Journal Title
Journal of the Korean Society for Nondestructive Testing
Journal Volume
40
Journal Issue
1
Journal Series
7 refs, 8 figs
Journal Page Range
p. 47-52
ISSN
1225-7842

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
51113134
Subject category
ENGINEERING;
Quality check status
Yes
Descriptors DEI
ALGORITHMS; ARTIFICIAL INTELLIGENCE; BREAD; COMPUTER CODES; DEFECTS; DETECTION; DISTRIBUTION; IMAGES; LEARNING; LIBRARIES; VERIFICATION; VISION;
Descriptors DEC
FOOD; MATHEMATICAL LOGIC;