A new method for measuring the response time of the high pressure ionization chamber
Creators
- 1. Institute of Nuclear and New Energy Technology, Tsinghua University, Beijing 102201 (China)
Description
Time response is an important performance characteristic for gas-pressurized ionization chambers. To study the time response, it is especially crucial to measure the ion drift time in high pressure ionization chambers. In this paper, a new approach is proposed to study the ion drift time in high pressure ionization chambers. It is carried out with a short-pulsed X-ray source and a high-speed digitizer. The ion drift time in the chamber is then determined from the digitized data. By measuring the ion drift time of a 15 atm xenon testing chamber, the method has been proven to be effective in the time response studies of ionization chambers. - Highlights: ► A method for measuring response time of high pressure ionization chamber is proposed. ► A pulsed X-ray producer and a digital oscilloscope are used in the method. ► The response time of a 15 atm Xenon testing ionization chamber has been measured. ► The method has been proved to be simple, feasible and effective.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apradiso.2012.04.010Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2012.04.010;
- PII
- S0969-8043(12)00283-7;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 70
- Journal Issue
- 8
- Journal Page Range
- p. 1718-1722
- ISSN
- 0969-8043
- CODEN
- ARISEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44101122
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Descriptors DEI
- IONIZATION CHAMBERS; PERFORMANCE; PULSES; TESTING; X RADIATION; XENON; X-RAY SOURCES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; RARE GASES
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.