Published August 2012 | Version v1
Journal article

A new method for measuring the response time of the high pressure ionization chamber

  • 1. Institute of Nuclear and New Energy Technology, Tsinghua University, Beijing 102201 (China)

Description

Time response is an important performance characteristic for gas-pressurized ionization chambers. To study the time response, it is especially crucial to measure the ion drift time in high pressure ionization chambers. In this paper, a new approach is proposed to study the ion drift time in high pressure ionization chambers. It is carried out with a short-pulsed X-ray source and a high-speed digitizer. The ion drift time in the chamber is then determined from the digitized data. By measuring the ion drift time of a 15 atm xenon testing chamber, the method has been proven to be effective in the time response studies of ionization chambers. - Highlights: ► A method for measuring response time of high pressure ionization chamber is proposed. ► A pulsed X-ray producer and a digital oscilloscope are used in the method. ► The response time of a 15 atm Xenon testing ionization chamber has been measured. ► The method has been proved to be simple, feasible and effective.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2012.04.010

Additional details

Identifiers

DOI
10.1016/j.apradiso.2012.04.010;
PII
S0969-8043(12)00283-7;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
70
Journal Issue
8
Journal Page Range
p. 1718-1722
ISSN
0969-8043
CODEN
ARISEF

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44101122
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
IONIZATION CHAMBERS; PERFORMANCE; PULSES; TESTING; X RADIATION; XENON; X-RAY SOURCES
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; RARE GASES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.