Investigation of structural perfection and faceting in highly Er-doped Yb3Al5O12 crystals
Creators
- 1. Institute of Electronic Materials Technology, Warsaw (Poland)
- 2. Institute of Atomic Energy, Otwock-Swierk (Poland)
- 3. HASYLAB, DESY, Hamburg (Germany)
Description
The undoped Yb3Al5O12 (YbAG) single crystals and doped with 1.5, 10 and 30 at% erbium were grown by the Czochralski method. The YbAG crystals offer efficient emission of laser beam of 2.94 μm and 1.55 μm important for practical applications in communication and medicine. The crystals were investigated by various synchrotron X-ray diffraction methods including white beam topographic methods, monochromatic beam topography and recording of the rocking curves. The experiments were performed at E2 and F1 experimental stations in HASYLAB. The investigations proved a good crystallographic perfection of the crystals, in most cases revealing only segregation fringes and growth facets. The crystallographic identification of the facets was performed together with direct evaluation of growth front radius from the transmission section topographs. Relative lattice parameter changes connected with erbium segregation were found to be less than 2 x 10-5 inside the segregation fringes and 8 x 10-5 in the facets. (copyright 2008 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/crat.200711099Additional details
Identifiers
Publishing Information
- Journal Title
- Crystal Research and Technology
- Journal Volume
- 43
- Journal Issue
- 4
- Journal Page Range
- p. 369-373
- ISSN
- 0232-1300
- CODEN
- CRTEDF
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 39063475
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM OXIDES; CRYSTAL GROWTH; CRYSTAL LATTICES; CZOCHRALSKI METHOD; ERBIUM COMPOUNDS; EXPERIMENTAL DATA; FERRITE GARNETS; LATTICE PARAMETERS; MONOCRYSTALS; SEGREGATION; X-RAY DIFFRACTION; YTTERBIUM COMPOUNDS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; CRYSTALS; DATA; DIFFRACTION; INFORMATION; MINERALS; NUMERICAL DATA; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SCATTERING
Optional Information
- Notes
- With 6 figs., 12 refs.. SICI: 0232-1300(200804)43:4<369::AID-CRAT200711099>3.0.TX;2-M