Surface characterization of plasma-treated polypropylene fibers
Creators
Description
Plasma treatment is increasingly being used for surface modification of different materials in many industries. In this study, different techniques were employed to characterize the surface properties of plasma treated polypropylene fibers. The chemical nature of the fiber sufaces has been investigated by X-ray photoelectron spectroscopy (XPS). The XPS examination indicated the presence of oxygen-containing functional groups on fiber surfaces after plasma treatment. The Atomic Force Microscopy (AFM) scans revealed the evolution of surface morphology under different experimental conditions. A Philips Environmental Scanning Electron Microscopy (ESEM) was also used to study the wetting behavior of the fibers. In the ESEM, relative humidity can be raised to 100% to facilitate the water condensation onto fiber surfaces for wetting observation. The ESEM observation revealed that the plasma treatment significantly altered the surface wettability of polypropylene fibers
Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2004.05.003;
- PII
- S1044580304000890;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 52
- Journal Issue
- 3
- Journal Page Range
- p. 231-235
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37057214
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTINIUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; FIBERS; HUMIDITY; MODIFICATIONS; MORPHOLOGY; OXYGEN; PLASMA; POLYPROPYLENE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; SURFACES; WATER; WETTABILITY; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ACTINIDE COMPOUNDS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; MICROSCOPY; MOISTURE; NONMETALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; POLYMERS; POLYOLEFINS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.