Published May 6, 2013
| Version v1
Journal article
Monte Carlo semi-empirical model for Si(Li) x-ray detector: Differences between nominal and fitted parameters
Creators
- 1. Departamento de Física Nuclear, Instituto Superior de Tecnología y Ciencias Aplicadas (InSTEC) Ave. Salvador Allende y Luaces. Quinta de los Molinos. Habana 10600. A.P. 6163, La Habana (Cuba)
- 2. Laboratorio do Acelerador Linear, Instituto de Física - Universidade de São Paulo Rua do Matão, Travessa R, 187, 05508-900, SP (Brazil)
Description
A detailed characterization of a X-ray Si(Li) detector was performed to obtain the energy dependence of efficiency in the photon energy range of 6.4 - 59.5 keV, which was measured and reproduced by Monte Carlo (MC) simulations. Significant discrepancies between MC and experimental values were found when the manufacturer parameters of the detector were used in the simulation. A complete Computerized Tomography (CT) detector scan allowed to find the correct crystal dimensions and position inside the capsule. The computed efficiencies with the resulting detector model differed with the measured values no more than 10% in most of the energy range.
Additional details
Identifiers
- DOI
- 10.1063/1.4804104;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1529
- Journal Issue
- 1
- Journal Page Range
- p. 134-136
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 35. Brazilian workshop on nuclear physics
- Dates
- 2-6 Sep 2012
- Place
- Sao Paulo (Brazil)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44068834
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S97: MATHEMATICAL METHODS AND COMPUTING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; COMPUTERIZED TOMOGRAPHY; CRYSTALS; EFFICIENCY; ENERGY DEPENDENCE; KEV RANGE; MONTE CARLO METHOD; PHOTONS; SI SEMICONDUCTOR DETECTORS; X RADIATION; X-RAY DETECTION; X-RAY SPECTROMETERS
- Descriptors DEC
- BOSONS; CALCULATION METHODS; DETECTION; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; IONIZING RADIATIONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SIMULATION; SPECTROMETERS; TOMOGRAPHY
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC